Analysis of trace Co in synthetic diamonds using synchrotron radiation excited X-ray fluorescence analysis
- 1 March 2000
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 210 (1-3) , 388-394
- https://doi.org/10.1016/s0022-0248(99)00717-4
Abstract
No abstract availableFunding Information
- Ministry of Education, Culture, Sports, Science and Technology
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