Study of very thin TiO2 films by high resolution transmission electron microscopy
- 31 August 1992
- journal article
- review article
- Published by Elsevier in Materials Chemistry and Physics
- Vol. 32 (2) , 203-206
- https://doi.org/10.1016/0254-0584(92)90278-g
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Effect of annealing temperature on TiO2 monolayer thin films as studied by waveguide raman spectroscopy and electron microscopyJournal of Materials Science Letters, 1992
- Nanocrystalline solidsJournal of Applied Crystallography, 1991
- Fabrication of tapers and lenslike waveguides by a microcontrolled dip coating procedureApplied Optics, 1988
- Standardization and control of a dip-coating procedure for optical thin films prepared from solutionCanadian Journal of Physics, 1988
- Real-time monitoring of crystallization and structural transformation of titania films with Raman spectroscopyOptics Letters, 1985
- Fabrication of planar dielectric waveguides with high optical damage thresholdIEEE Journal of Quantum Electronics, 1983
- Embossing technique for fabricating integrated optical components in hard inorganic waveguiding materialsOptics Letters, 1983
- Refinement of the structure of anatase at several temperatures*Zeitschrift für Kristallographie, 1972
- Atomabstände und Bindungswinkel im Brookit, TiO2Acta Crystallographica, 1961