Image enhancement in near-field scanning optical microscopy with laser-trapped metallic particles
- 15 January 1999
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 24 (2) , 74-76
- https://doi.org/10.1364/ol.24.000074
Abstract
A trapped-particle near-field scanning optical microscope is constructed by use of submicrometer- or micrometer-sized metallic particles (gold and silver) to increase scattering efficiency. The image contrast of the evanescent-wave interference pattern on the surface of a prism upon total internal reflection, obtained with trapped gold particles of diameter 0.1 and , is improved by a factor of approximately 2 and 1.5, respectively, compared with that obtained with trapped polystyrene particles of similar size. The use of a gold particle leads to image contrast that is approximately three times as great as that obtained with a gold particle, and interference patterns of a subwavelength period are obtained in both cases.
Keywords
This publication has 12 references indexed in Scilit:
- Optical trapping of metallic particles by a fixed Gaussian beamOptics Letters, 1998
- Gold-bead scanning near-field optical microscope with laser-force position controlOptics Letters, 1997
- Near-Field Scanning Optical Microscope with a Laser Trapped ProbeJapanese Journal of Applied Physics, 1994
- Optical trapping of microscopic metal particlesOptics Letters, 1994
- Optical trapping of metallic Rayleigh particlesOptics Letters, 1994
- Two-color trapped-particle optical microscopyOptics Letters, 1994
- Optical near-field imaging with a semiconductor probe tipApplied Physics Letters, 1994
- Parametric study of the forces on microspheres held by optical tweezersApplied Optics, 1994
- Near-field scanning optical microscope with a metallic probe tipOptics Letters, 1994
- Scanning-force microscope based on an optical trapOptics Letters, 1993