Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, Auger electron spectroscopy, and atom-probe field-ion microscopy
- 1 August 1982
- journal article
- Published by Elsevier in Surface Science
- Vol. 120 (1) , 90-102
- https://doi.org/10.1016/0039-6028(82)90276-x
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Atom-probe microanalysis of TiC coatings on cemented carbidesScripta Metallurgica, 1981
- Electronic properties of the clean and hydrogen-covered TiC(111) Ti-terminated polar surfaceSolid State Communications, 1981
- Clean TiC(001) surface and oxygen chemisorption studied by work function measurement, angle-resolved X-RAY photoelectron spectroscopy, ultraviolet photoelectron spectroscopy and ion scattering spectroscopySurface Science, 1981
- Thermionic emission properties of hexaboridesSurface Science, 1980
- Thermionic emission properties of a single-crystal LaB6 cathodeJournal of Applied Physics, 1980
- Growth rate of titanium carbide whiskers in chemical vapor depositionJournal of Crystal Growth, 1977
- Energy distribution of field-emitted electrons from TiC single crystalSurface Science, 1977
- Field ion microscopy of refractory metal carbidesPhilosophical Magazine, 1968
- Field-ion Microscopy of Titanium CarbidePhilosophical Magazine, 1967
- Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory MetalsJournal of Applied Physics, 1965