Thermal analysis by high-temperature microscopy
- 1 July 1963
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 40 (7) , 352-354
- https://doi.org/10.1088/0950-7671/40/7/305
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Spontaneous Phase Changes during Rapid Cooling of Beryl Melts; their Detection and CharacterizationNature, 1963
- Improved microfurnace power supplyJournal of Scientific Instruments, 1961
- 220. High-temperature phase equilibria in the system dicalcium silicate–tricalcium phosphateJournal of the Chemical Society, 1959
- X-ray analysis technique for very high temperaturesJournal of Scientific Instruments, 1959
- A simple microscope attachment for observing high-temperature phenomenaJournal of Scientific Instruments, 1954