Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy
- 9 November 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 81 (19) , 4156-4159
- https://doi.org/10.1103/physrevlett.81.4156
Abstract
It is quantitatively explained why incoherent transmission electron microscope imaging is extremely robust to the effects of chromatic aberration, which usually limits the resolution in the conventional coherent mode of imaging. Combining this robustness with using underfocus to counter the effects of spherical aberration, we demonstrate subangstrom lattice resolution and information transfer to 0.078 nm.Keywords
This publication has 17 references indexed in Scilit:
- Accurate structure determination from image reconstruction in ADF STEMJournal of Microscopy, 1998
- The realization of atomic resolution with the electron microscopeReports on Progress in Physics, 1997
- Resolution beyond the 'information limit' in transmission electron microscopyNature, 1995
- Super-resolution by aperture synthesis: tilt series reconstruction in CTEMUltramicroscopy, 1995
- Electron Holography Surmounts Resolution Limit of Electron MicroscopyPhysical Review Letters, 1995
- Incoherent imaging of thin specimens using coherently scattered electronsProceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences, 1993
- Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopyPhysical Review Letters, 1992
- High-resolution incoherent imaging of crystalsPhysical Review Letters, 1990
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- ber einige Fehler von ElektronenlinsenThe European Physical Journal A, 1936