Effect of CMOS driver loading conditions on simultaneous switching noise
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B
- Vol. 17 (4) , 480-485
- https://doi.org/10.1109/96.338712
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Simultaneous switching ground noise calculation for packaged CMOS devicesIEEE Journal of Solid-State Circuits, 1991
- Delta-I noise specification for a high-performance computing machineProceedings of the IEEE, 1985
- Computing Inductive Noise of Chip PackagesAT&T Bell Laboratories Technical Journal, 1984