A theoretical analysis of HREM imaging for 〈110〉 tetrahedral semiconductors
- 1 January 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 27 (1) , 19-34
- https://doi.org/10.1016/0304-3991(89)90198-8
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A systematic analysis of HREM imaging of sphalerite semiconductorsUltramicroscopy, 1989
- A systematic analysis of HREM imaging of Wurtzite semiconductorsUltramicroscopy, 1989
- A systematic analysis of HREM imaging of elemental semiconductorsUltramicroscopy, 1989
- Approaching atomic-resolution electron microscopyUltramicroscopy, 1985
- High resolution electron microscopic study of tin dioxide crystalsJournal of Solid State Chemistry, 1983
- High-resolution lattice imaging of cadmium telluridePhilosophical Magazine A, 1982
- A simple method for the determination of structure-factor phase relationships and crystal polarity using electron diffractionJournal of Applied Crystallography, 1982
- Electron-optical imaging of Ti6O11at 1·6 Å point-to-point resolutionPhilosophical Magazine A, 1978
- Calculated images of crystal lattices by axial illumination 1 MeV electronsActa Crystallographica Section A, 1975
- Fourier Images IV: The Phase GratingProceedings of the Physical Society, 1960