A systematic analysis of HREM imaging of elemental semiconductors
- 28 February 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 27 (1) , 35-51
- https://doi.org/10.1016/0304-3991(89)90199-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- A systematic analysis of HREM imaging of sphalerite semiconductorsUltramicroscopy, 1989
- A systematic analysis of HREM imaging of Wurtzite semiconductorsUltramicroscopy, 1989
- A theoretical analysis of HREM imaging for 〈110〉 tetrahedral semiconductorsUltramicroscopy, 1989
- Aspects of HREM of tetrahedral semiconductorsUltramicroscopy, 1985
- The importance of beam alignment and crystal tilt in high resolution electron microscopyUltramicroscopy, 1983