The importance of beam alignment and crystal tilt in high resolution electron microscopy
- 1 January 1983
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 11 (4) , 263-281
- https://doi.org/10.1016/0304-3991(83)90006-2
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Recent improvements to the Cambridge University 600 kV High Resolution Electron MicroscopeJournal of Microscopy, 1983
- An investigation of order/disorder in a chromia‐doped rutile by high‐resolution electron microscopyJournal of Microscopy, 1983
- Practical computation of amplitudes and phases in electron diffractionUltramicroscopy, 1983
- The accomplishments and prospects of high resolution imaging methodsUltramicroscopy, 1982
- Atomic Resolution with the Electron MicroscopeInterdisciplinary Science Reviews, 1981
- Units and conventions in electron microscopy, for use in ultramicroscopyUltramicroscopy, 1980
- A practical procedure for alignment of a high resolution electron microscopeUltramicroscopy, 1979
- Coma-free alignment of high resolution electron microscopes with the aid of optical diffractogramsUltramicroscopy, 1978
- Numerical evaluations ofN-beam wave functions in electron scattering by the multi-slice methodActa Crystallographica Section A, 1974
- Mixed oxides of titanium and niobium. I.Acta Crystallographica, 1961