Far-infrared emission by resonant-polaron effects in narrow-band-gapTe
- 2 September 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 67 (10) , 1310-1313
- https://doi.org/10.1103/physrevlett.67.1310
Abstract
We report on the first experimental observation of far-infrared emission within the reststrahlen band of a semiconductor. We have performed Fourier-transform emission experiments on narrow-band-gap Te (x≊0.17). Under -laser excitation, we find an emission spectrum at the longitudinal-optical-phonon energies of the material (137.5 and 157.5 ). The appearance of the optical emission signal is caused by interband polaron effects arising from the resonant matching between longitudinal-optical phonons and electron-hole excitations, as suggested in recent theoretical calculations.
Keywords
This publication has 16 references indexed in Scilit:
- Electron-hole recombination in narrow-band-gapHg1−xCdxTe and stimulated emission of LO phononsPhysical Review B, 1990
- Stimulated emission of LO phonons in narrow-band-gap semiconductorsPhysical Review B, 1990
- Tunable cyclotron-resonance laser in germaniumPhysical Review Letters, 1990
- Fourier transform infrared photoluminescence of Hg1-xCdxTeJournal of Crystal Growth, 1990
- Intersubband emission from semiconductor superlattices excited by sequential resonant tunnelingPhysical Review Letters, 1989
- Modulation-doped HgCdTeJournal of Vacuum Science & Technology A, 1989
- Interband Resonant Polarons in the Semimagnetic Zero-Gap SemiconductorPhysical Review Letters, 1988
- Calculation of the Auger lifetime in p-type Hg1-xCdxTeJournal of Applied Physics, 1981
- Plasma-Wave Instability in Narrow-Gap SemiconductorsPhysical Review Letters, 1970
- Band Structure and Laser Action inPhysical Review Letters, 1966