GaAs MMIC yield modeling
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The use and evaluation of yield models in integrated circuit manufacturingIEEE Transactions on Semiconductor Manufacturing, 1990
- On yield, fault distributions, and clustering of particlesIBM Journal of Research and Development, 1986
- The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributionsIBM Journal of Research and Development, 1985
- Integrated circuit yield statisticsProceedings of the IEEE, 1983