Evaluation of the interfacial resistance of thin film interconnexions
- 1 August 1968
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 7 (3) , 185-212
- https://doi.org/10.1016/0026-2714(68)90013-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The performance and evaluation of thin film insulating crossoversMicroelectronics Reliability, 1968