Practical application of HgI2 detectors to a space-flight scanning electron microscope
- 1 November 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 283 (2) , 348-351
- https://doi.org/10.1016/0168-9002(89)91383-1
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Performance and durability of HgI/sub 2/ X-ray detectors for space missionsIEEE Transactions on Nuclear Science, 1989
- Low Energy X-Ray Spectra Measured with a Mercuric Iodide Energy Dispersive Spectrometer in a Scanning Electron MicroscopeIEEE Transactions on Nuclear Science, 1986
- Mercuric iodide (HgI2) semiconductor devices as charged particle detectorsNuclear Instruments and Methods in Physics Research, 1983
- A high-resolution Si(Li) spectrometer with thermoelectric coolingNuclear Instruments and Methods, 1979