Bestimmung der anisotropie der effektiven masse in n-Bi2Te3 durch reflexionsmessungen im ultraroten
- 1 November 1964
- journal article
- Published by Elsevier in Journal of Physics and Chemistry of Solids
- Vol. 25 (11) , 1261-1267
- https://doi.org/10.1016/0022-3697(64)90024-1
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Plasma Edge in Bi2Te3Journal of Applied Physics, 1963
- De Haas-van Alphen and high field galvanomagnetic studies of the Bi2Te3 valence band structureSolid State Communications, 1963
- Notizen: Oszillatorische magnetische Widerstandsänderung an Wismut-Tellurid bei tiefen TemperaturenZeitschrift für Naturforschung A, 1963
- Infrared Reflectance of Evaporated Aluminum FilmsJournal of the Optical Society of America, 1962
- Determination of Optical Constants and Carrier Effective Mass of SemiconductorsPhysical Review B, 1957