Atomic correlations of stepped surfaces and interfaces

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Abstract
We have developed a scheme to evaluate the atomic pair correlation function exactly for stepped surfaces and interfaces. This pair correlation function is particularly useful in calculating the diffracted beam width and shape from an arbitrary distribution of steps using low-energy electron diffraction, reflection high-energy electron diffraction, and grazing x-ray diffraction. We have made model calculations for several realistic terrace width distributions. By comparing the calculated and measured diffracted beam widths and shapes, one can extract valuable, quantitative structural information on surfaces, interfaces, and epitaxially grown films.

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