Misfit strain and misfit dislocations in lattice mismatched epitaxial layers and other systems
- 1 June 1997
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 75 (6) , 1461-1515
- https://doi.org/10.1080/01418619708223740
Abstract
Heterostructures in the form of thin layers of one material grown on a substrate have been the subject of intense study for several years. In the case of semiconductor systems the aim is to grow epitaxial layers of, for example, Si1-xGex on Si, and devices based on such structures are already in use. Much is known, as is summarized in this review, about the stability of such systems against the insertion of dislocations, and about the critical thicknesses up to which strained layer structures are stable. The effects of dislocation nucleation and the dynamics of dislocation motion which lead to strain relaxation in metastable systems are also reviewed. The present state of theoretical understanding is compared with what is known experimentally. For metallic systems, which often exhibit magnetic properties, the underlying problems of lattice mismatch and strain relief are similar, but much of the interest has been concentrated on the commensurate-incommensurate transition in both structurally and magnetically modulated materials. The theory of this transition is reviewed, both for metallic systems and for epitaxial layers on graphite. In bringing together these different classes of systems within one review, it has been possible to demonstrate the parallels between them. It is hoped that, as a result, transfers of ideas between the fields will be promoted.Keywords
This publication has 122 references indexed in Scilit:
- A new study of critical layer thickness, stability and strain relaxation in pseudomorphic gexsi1-xstrained epilayersPhilosophical Magazine A, 1992
- Blue-green injection laser diodes in (Zn,Cd)Se/ZnSe quantum wellsApplied Physics Letters, 1991
- The energy of an array of dislocationsPhilosophical Magazine A, 1991
- A new type of misfit dislocation multiplication process in InxGa1−xAs/GaAs strained-layer superlatticesPhilosophical Magazine Letters, 1991
- The energy of an array of dislocations: Implications for strain relaxation in semiconductor heterostructuresPhilosophical Magazine A, 1990
- The structural stability of uncapped versus buried Si1−xGex strained layers through high temperature processingThin Solid Films, 1989
- Dislocation nucleation near the critical thickness in GeSi/Si strained layersPhilosophical Magazine A, 1989
- Investigation of dislocation mobilities in germanium in the low-temperature range byin situstraining experimentsPhilosophical Magazine A, 1988
- A high resolution synchrotron x-ray study of the weakly-incommensurate phase of high stage bromine-intercalated graphiteZeitschrift für Physik B Condensed Matter, 1985
- Theory of the Structural Phase Transformations in Tetrathiafulvalene-Tetracyanoquinodimethane (TTF-TCNQ)Physical Review Letters, 1976