The structure of thin NiO(100) films grown on Ni(100) as determined by low-energy-electron diffraction and scanning tunneling microscopy
- 1 August 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 253 (1-3) , 116-128
- https://doi.org/10.1016/0039-6028(91)90585-g
Abstract
No abstract availableThis publication has 40 references indexed in Scilit:
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