Stress in Evaporated Copper Films
- 1 November 1962
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 1 (5)
- https://doi.org/10.1143/jjap.1.304
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Isotropic Stress Measurements in Permalloy FilmsJournal of Applied Physics, 1962
- Annealing of residual stress in silicon monoxide filmsBritish Journal of Applied Physics, 1961
- Stress in Very Thin Vacuum-Evaporated Films of SilverJournal of the Physics Society Japan, 1960
- Dielectric Thin Films*Journal of the Optical Society of America, 1957
- The Structure of Evaporated Metal Films and Their Optical PropertiesJournal of the Optical Society of America, 1950