A k-out-of-N:G redundant system with dependent failure rates and common-cause failures
- 1 January 1988
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 28 (2) , 201-203
- https://doi.org/10.1016/0026-2714(88)90351-4
Abstract
No abstract availableKeywords
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