COMPACTEST: A METHOD TO GENERATE COMPACT TEST SETS FOR COMBINATIONAL CIRCUITS

This publication has 16 references indexed in Scilit:

• Advanced automatic test pattern generation and redundancy identification techniques
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• ATPG for ultra-large structured designs
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• SOCRATES: a highly efficient automatic test pattern generation system
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
• A topological search algorithm for ATPG
  Published by Association for Computing Machinery (ACM) ,1987
• SMART And FAST: Test Generation for VLSI Scan-Design Circuits
  IEEE Design & Test of Computers, 1986
• On the Complexity of Estimating the Size of a Test Set
  IEEE Transactions on Computers, 1984
• On the Acceleration of Test Generation Algorithms
  IEEE Transactions on Computers, 1983
• An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
  IEEE Transactions on Computers, 1981
• PODEM-X: An Automatic Test Generation System for VLSI Logic Structures
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1981
• Fault Detection in Fanout-Free Combinational Networks
  IEEE Transactions on Computers, 1973