The use of a flat suppressor in low-energy electron diffraction
- 1 August 1989
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 22 (8) , 651-656
- https://doi.org/10.1088/0022-3735/22/8/023
Abstract
The authors discuss the advantages of using a flat suppressor in low-energy electron diffraction (LEED). A flat-suppressor system which incorporates a channel electron multiplier plate and a phosphor screen detector is described. The LEED patterns can be analysed using standard lineshape fitting programs. Preliminary results from experiments on the hexagonal incommensurate phase of potassium chemisorbed on Ni(111) are presented.Keywords
This publication has 12 references indexed in Scilit:
- Alkali metal atoms adsorbed on Ni{111}: Surface interactionsSurface Science, 1989
- Low-energy electron diffraction study of potassium adsorbed on Ni(111)Physical Review B, 1988
- Observation of Two-Dimensional Hexatic Behavior in Free-Standing Liquid-Crystal Thin FilmsPhysical Review Letters, 1988
- Melting of monolayer xenon on silver: The hexatic phase in the weak-substrate limitPhysical Review Letters, 1987
- Experimental observation of two-stage melting in a classical two-dimensional screened Coulomb systemPhysical Review Letters, 1987
- Orientational order in xenon fluid monolayers on single crystals of exfoliated graphitePhysical Review B, 1985
- Low-energy electron diffraction system using a position-sensitive detectorReview of Scientific Instruments, 1985
- The melting of submonolayer ethane adsorbed on graphite : a LEED studyJournal de Physique Lettres, 1985
- Instrumentation for low-energy electron diffractionReview of Scientific Instruments, 1983
- Low‐energy electron diffraction from inert gas overlayersJournal of Vacuum Science and Technology, 1977