mubeam system for study of single event upset of semiconductor devices
- 1 February 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 64 (1-4) , 362-366
- https://doi.org/10.1016/0168-583x(92)95495-d
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Three-dimensional microanalysis using a focused MeV oxygen ion beamNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Ion microprobe system at Waseda University for semiconductor analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Nuclear mubeams: Realization and use as scientific toolNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990