In situ real-time studies of GaN growth on 6H–SiC(0001) by low-energy electron microscopy (LEEM)
- 15 June 1998
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 189-190, 310-316
- https://doi.org/10.1016/s0022-0248(98)00273-5
Abstract
No abstract availableKeywords
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