White beam, X-ray, energy-dispersive diffractometry using synchrotron radiation
- 1 June 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 152 (1) , 293-296
- https://doi.org/10.1016/0029-554x(78)90282-3
Abstract
No abstract availableKeywords
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- Analysis of transient phenomena in crystalline and liquid structures using neutron time-of-flight techniquesNuclear Instruments and Methods, 1975
- Si(Li) semiconductor detector in angle and energy dispersive X-ray diffractometryJournal of Physics E: Scientific Instruments, 1974
- Density of the Lunar SurfaceScience, 1968