Si(Li) semiconductor detector in angle and energy dispersive X-ray diffractometry
- 1 November 1974
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 7 (11) , 951-954
- https://doi.org/10.1088/0022-3735/7/11/026
Abstract
An X-ray diffractometer system is described with which angle dispersive, energy dispersive and combined angle and energy dispersive diffraction measurements can be carried out. The appropriateness and the advantages of these methods under different experimental conditions are discussed. The preliminary measurements have shown promising results in using other than characteristic wavelengths in angle dispersive X-ray diffractometry. A combined angle and energy dispersive method is realized experimentally.Keywords
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