Evidence of Self-Affine Rough Interfaces in a Langmuir-Blodgett Film from X-Ray Reflectometry
- 17 April 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 74 (16) , 3205-3208
- https://doi.org/10.1103/physrevlett.74.3205
Abstract
A Langmuir-Blodgett multilayer film of tricosenoic acid with a cadmium-substituted headgroup has been studied by x-ray reflectometry. The diffuse or off-specular scattering close to the positions of the 20 observed Bragg peaks in the reflectivity profile has been studied. Its line shape has been found to be Lorentzian and the half-widths of the peaks vary according to the square of the longitunal wave vector . This suggests that the film is characterized by self-affine rough interfaces, with no cutoff length, corresponding to a roughness texture .
Keywords
This publication has 16 references indexed in Scilit:
- Interfacial structure of Co/Pt multilayersPhysical Review B, 1993
- Surface scattering of x rays in thin films. Part I. Theoretical treatmentThe Journal of Chemical Physics, 1992
- Surface scattering of x rays in thin films. Part II. Experiments on thin soap filmsThe Journal of Chemical Physics, 1992
- Thermal roughness of a close-packed metal surface: Pt(001)Physical Review Letters, 1992
- Surface X-ray diffractionReports on Progress in Physics, 1992
- Reflectivity using neutrons or X-rays? A critical comparisonPhysica B: Condensed Matter, 1991
- X-ray-scattering study of capillary-wave fluctuations at a liquid surfacePhysical Review Letters, 1991
- X-ray and neutron scattering from rough surfacesPhysical Review B, 1988
- Thermal roughening of the copper (110) surface: An x-ray diffraction experimentPhysical Review Letters, 1987
- Scattering of X-rays from crystal surfacesJournal of Physics C: Solid State Physics, 1985