Nanomechanical investigations and modifications of thin films based on scanning force methods

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Abstract
We have studied the nanomechanical properties of thin films epitaxially grown on GeS(001) substrates by scanning force methods. The local frictional coefficient derived for islands was found to be significantly smaller than on the GeS(001) substrate demonstrating that well ordered films can lower the frictional force even compared with a layered material. In the second part of our study, we have used a scanning force microscope (SFM) for nanomechanical modification of a variety of thin film substrates including high- superconductors and thin metallic films on insulating substrates. A combination of photolithography and SFM-based nanofabrication allowed to link the nanoscopic to the macroscopic world and to perform transport measurements on the nanofabricated structures.