Nature of the Defect Determining the Fermi Level Stabilization in Irradiated Silicon
- 16 December 1982
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 74 (2) , 445-452
- https://doi.org/10.1002/pssa.2210740209
Abstract
No abstract availableKeywords
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- Structure of multiple-vacancy (oxygen) centers in irradiated siliconRadiation Effects, 1971
- Radiation Defects Created by Co60 γ‐Rays in p‐ and n‐Type Si of High PurityPhysica Status Solidi (b), 1969
- Recombination MechanismsPhysica Status Solidi (b), 1968