Scanning tunneling microscope computer automation
- 1 March 1987
- journal article
- Published by Elsevier in Surface Science
- Vol. 181 (1-2) , 200-209
- https://doi.org/10.1016/0039-6028(87)90159-2
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Characterization of electron trapping defects on silicon by scanning tunneling microscopySurface Science, 1987
- Computer automation for scanning tunneling microscopyIBM Journal of Research and Development, 1986
- Surface Electronic Structure of Si (111)-(7×7) Resolved in Real SpacePhysical Review Letters, 1986
- Si(001) Dimer Structure Observed with Scanning Tunneling MicroscopyPhysical Review Letters, 1985
- Personal Instrument (PI)—A PC-based signal processing systemIBM Journal of Research and Development, 1985
- Scanning tunneling microscopySurface Science, 1983
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982