Structure-sensitive magnetic properties of RF sputtered NiFe films
- 1 November 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 15 (6) , 1821-1823
- https://doi.org/10.1109/tmag.1979.1060518
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- The relationship among electromigration, passivation thickness, and common-emitter current gain degradation within shallow junction NPN bipolar transistorsJournal of Applied Physics, 1982
- Columnar microstructure in vapor-deposited thin filmsThin Solid Films, 1977
- Anisotropic Microstructure in Evaporated Amorphous Germanium FilmsPhysical Review Letters, 1972
- Perpendicular Anisotropy of Electrodeposited Nickel and Nickel-Phosphorus FilmsJournal of the Physics Society Japan, 1970
- 360° Walls and Strong Stripe Domains in Permalloy FilmsPhysica Status Solidi (b), 1968
- CRITICAL THICKNESS AND PERPENDICULAR ANISOTROPY OF EVAPORATED PERMALLOY FILMS WITH STRIPE DOMAINSApplied Physics Letters, 1967
- Micromagnetics on Stripe Domain Films. I. Critical CasesJournal of the Physics Society Japan, 1966
- Perpendicular Anisotropy in Polycrystalline Ni-Fe Thin FilmsJournal of Applied Physics, 1966
- Collimation corrections in small angle X-ray scatteringActa Crystallographica, 1965