Determination of Surface Structures using LEED and Energy Analysis of Scattered Electrons
- 1 January 1969
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 40 (1) , 314-318
- https://doi.org/10.1063/1.1657051
Abstract
It is shown that the energy analysis of scattered electrons (EASE) is a useful tool when used in conjunction with the conventional LEED surface studies. It is demonstrated that the sensitivity is such that 0.02 monolayers of Cs can be detected on a Si surface. The Auger peak for K on a Ge(111) surface has been calibrated quantitatively and this calibration has been used to determine the K coverage after the overlayer was partially desorbed by heat treatments. The coverage measurements were used along with the LEED patterns to determine the surface structure.This publication has 9 references indexed in Scilit:
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