An automated scanning ellipsometer
- 1 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 212-220
- https://doi.org/10.1016/0039-6028(76)90448-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Modulation ellipsometry and its application to the study of the electrode-electrolyte interfaceSurface Science, 1973
- An Automatic Ellipsometer for Use in Electrochemical InvestigationsReview of Scientific Instruments, 1970
- Circuit design for an electronic self-nulling ellipsometerSurface Science, 1969
- A high speed precision automatic ellipsometerSurface Science, 1969
- An ellipsometer for following film growthSurface Science, 1969