Modified elemental sensitivity factors for auger electron spectroscopy
- 31 December 1985
- journal article
- research article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 36 (1) , 99-104
- https://doi.org/10.1016/0368-2048(85)80010-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Depth profiling in the investigation of industrial processesNuclear Instruments and Methods in Physics Research, 1981
- Matrix effects in quantitative auger analysis of dilute alloysSurface Science, 1979
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Relative sensitivity factors for quantitative Auger analysis of binary alloysSurface Science, 1977