Optical Systems for Observing Surface Topography by Frustrated Total Internal Reflection and by Interference
- 1 October 1964
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 35 (10) , 1340-1345
- https://doi.org/10.1063/1.1718740
Abstract
If surface topography is examined by frustrated total internal reflection, light leaves the object plane in a direction displaced from the normal by at least the critical angle. If the optical system is arranged with its axis parallel to the emerging light, there will be distortion and tilting of the Guassian image plane. These disappear if the axis of the optical system is made normal to the object plane, but the system must then deal with light entering it at greater than the critical angle. A microscope objective can do this if its numerical aperture exceeds 1. A device has been designed to adapt a conventional microscope for the study of topography, both by frustrated internal reflection and interference. Low magnification systems for use with frustrated internal reflection are also discussed.Keywords
This publication has 6 references indexed in Scilit:
- Generalized Aperture and the Three-Dimensional Diffraction ImageJournal of the Optical Society of America, 1964
- Use of Frustrated Total Internal Reflection to Measure Film Thickness and Surface ReliefsJournal of Applied Physics, 1962
- Refractometer MicroscopeApplied Optics, 1962
- Penetration of Microwaves into the Rarer Medium in Total ReflectionJournal of the Optical Society of America, 1960
- A Unit-Magnification Optical System for the Attainment of Long Working Distances in MicroscopyProceedings of the Physical Society. Section B, 1949
- Reflecting microscopesProceedings of the Physical Society, 1947