High-accuracy circuits for on-chip capacitance ratio testing or sensor readout
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
- Vol. 41 (9) , 637-639
- https://doi.org/10.1109/82.326597
Abstract
Novel CMOS circuits are described for the on-chip measurement of capacitor ratios. They can provide a high-accuracy A/D interface for capacitive sensors, or allow the precise calibration of switched-capacitor DACs, amplifiers and other circuits utilizing ratioed capacitors. Various structures are proposed and the limitations of their accuracy are analyzed. Computer simulations illustrate the operation and verify the anticipated robustness and high accuracy of the system even in the presence of nonidealitiesKeywords
This publication has 5 references indexed in Scilit:
- CMOS absolute value precision capacitance measurement systemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Finite gain compensation techniques for high-Q bandpass SC filtersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A digital readout technique for capacitive sensor applicationsIEEE Journal of Solid-State Circuits, 1988
- A second-order high-resolution incremental A/D converter with offset and charge injection compensationIEEE Journal of Solid-State Circuits, 1988
- A switched-capacitor interface for intelligent capacitive transducersIEEE Transactions on Instrumentation and Measurement, 1986