Ellipsometric study of Fano resonance in heavily doped p-type Si and SiGe alloys
- 1 February 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 313-314, 656-660
- https://doi.org/10.1016/s0040-6090(97)00972-3
Abstract
No abstract availableKeywords
Funding Information
- Ministerstvo Školství, Mládeže a Tělovýchovy
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