Application of the photoelasticity method to the investigation of stresses around individual dislocations and their influence on crystal properties
- 16 October 1970
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 3 (2) , 383-392
- https://doi.org/10.1002/pssa.19700030212
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Direct Measurement of Photoelastic Coefficients by Ultrasonic Light Diffraction TechniqueJapanese Journal of Applied Physics, 1969
- Photoelastic Constants of Selected Ultrasonic Delay-Line CrystalsJournal of Applied Physics, 1968
- Photoelastic Properties of Selected Materials and Their Relevance for Applications to Acoustic Light Modulators and ScannersJournal of Applied Physics, 1967
- The observation of dislocations in yttrium gallium garnet by a photoelastic methodJournal of Materials Science, 1967
- Microwave Elastic Properties of Nonmagnetic GarnetsJournal of Applied Physics, 1963
- Birefringence Caused by Edge Dislocations in SiliconPhysical Review B, 1958
- Photographs of the Stress Field Around Edge DislocationsPhysical Review B, 1956
- LXXXII. Edge dislocations in anisotropic materialsJournal of Computers in Education, 1949
- Plastic deformation of silver chloride I. Internal stresses and the glide mechanismProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1949
- Elektrodynamik und Wellenmechanik vom Standpunkt des KorrespondenzprinzipsThe European Physical Journal A, 1927