TASTE: a tool for analog system testability evaluation
- 1 January 1988
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 829-838
- https://doi.org/10.1109/test.1988.207870
Abstract
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are presenKeywords
This publication has 3 references indexed in Scilit:
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- A Computational Approach for the Diagnosability of Dynamical CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
- Fault diagnosis for linear systems via multifrequency measurementsIEEE Transactions on Circuits and Systems, 1979