Film thickness determination by electron probe microanalysis
- 31 December 1966
- journal article
- Published by Elsevier in Corrosion Science
- Vol. 6 (9) , 397-420
- https://doi.org/10.1016/0010-938x(66)80013-6
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Backscattering of Kilovolt Electrons from SolidsPhysical Review B, 1954