The Application of Thick Hydrogenated Amorphous Silicon Layers to Charged Particle and X-Ray Detection
- 1 January 1989
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Signal generation in a hydrogenerated amorphous silicon detectorIEEE Transactions on Nuclear Science, 1989
- Hydrogenated amorphous silicon pixel detectors for minimum ionizing particlesNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- Detection of minimum-ionizing particles in hydrogenated amorphous siliconNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- Effect of primary ionization in amorphous silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- A measurement of the light yield of common inorganic scintillatorsIEEE Transactions on Nuclear Science, 1988
- Signal, recombination effects and noise in amorphous silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1987
- Detection of charged particles in amorphous silicon layersNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
- Signal Processing for Semiconductor DetectorsIEEE Transactions on Nuclear Science, 1982
- Bandgap Dependence and Related Features of Radiation Ionization Energies in SemiconductorsJournal of Applied Physics, 1968