Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: an integral representation
- 1 February 1995
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 12 (2) , 325-332
- https://doi.org/10.1364/josaa.12.000325
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 11 references indexed in Scilit:
- An Analytical Solution of Vector Diffraction for Focusing Optical Systems with Seidel AberrationsJournal of Modern Optics, 1993
- Aberrations in confocal fluorescence microscopy induced by mismatches in refractive indexJournal of Microscopy, 1993
- Analysis of electromagnetic waves refracted by a spherical dielectric interfaceJournal of the Optical Society of America A, 1991
- Focusing of electromagnetic waves through a dielectric interfaceJournal of the Optical Society of America A, 1984
- Conditions for the validity of the Debye integral representation of focused fieldsOptics Communications, 1981
- Radiation of electromagnetic fields in biaxially anisotropic media*Journal of the Optical Society of America, 1978
- Reflection and refraction of an arbitrary electromagnetic wave at a plane interfaceJournal of the Optical Society of America, 1976
- Radiation of electromagnetic fields in uniaxially anisotropic media*Journal of the Optical Society of America, 1976
- Electromagnetic diffraction in optical systems - I. An integral representation of the image fieldProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1959
- Das Verhalten von Lichtwellen in der Nähe eines Brennpunktes oder einer BrennlinieAnnalen der Physik, 1909