A New Measurement System for Oscillator Noise Characterization
- 1 January 1987
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
The prediction of oscillator noise has been one of the more difficult problems in circuit analysis. A new system for measuring modulation (amplitude or phase) transfer and upconversion is presented which allows insight into the causes of oscillator noise. This system can measure modulation at less than -50dbc and accurately predict the oscillator noise spectrum.Keywords
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