Anisotropy micro-ellipsometry for in-situ determination of optical and crystallographic properties of anisotropic solids and layers with as an example
- 1 March 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 274 (1-2) , 82-94
- https://doi.org/10.1016/0040-6090(95)07078-8
Abstract
No abstract availableKeywords
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