Generalized ellipsometry and the 4 × 4 matrix formalism
- 30 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 293-306
- https://doi.org/10.1016/0039-6028(76)90454-4
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
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- Azimuthal Misalignment and Surface Anisotropy as Sources of Error in EllipsometryApplied Optics, 1970
- Refraction in Stratified, Anisotropic Media*Journal of the Optical Society of America, 1970
- Determination of the Optical Constants of Anisotropic Crystals*Journal of the Optical Society of America, 1969