Ellipsometry of anisotropic thin films
- 1 May 1974
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 64 (5) , 631-638
- https://doi.org/10.1364/josa.64.000631
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 12 references indexed in Scilit:
- Ellipsometry of anisotropic surfacesJournal of the Optical Society of America, 1973
- The fixed-polarizer nulling scheme in generalized ellipsometryOptics Communications, 1973
- Transmission ellipsometry and polarization spectrometry of thin layersThe Journal of Physical Chemistry, 1972
- Spacing of the multiple nulls in generalized ellipsometryOptics Communications, 1972
- Ellipsometric Measurement of the Polarization Transfer Function of an Optical System*Journal of the Optical Society of America, 1972
- Polarization Transfer Function of an Optical System as a Bilinear Transformation*Journal of the Optical Society of America, 1972
- Ellipsometry of Anisotropic FilmsJournal of the Optical Society of America, 1971
- Analyses and Corrections of Instrumental Errors in EllipsometryJournal of the Optical Society of America, 1970
- Ellipsometry Using a Retardation Plate as Compensator*Journal of the Optical Society of America, 1967
- Exact Theory of Retardation Plates*Journal of the Optical Society of America, 1964