Ellipsometry of anisotropic surfaces
- 1 August 1973
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 63 (8) , 958-964
- https://doi.org/10.1364/josa.63.000958
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 11 references indexed in Scilit:
- Ellipsometry of Anisotropic FilmsJournal of the Optical Society of America, 1971
- Ellipsometry with Imperfect Components Including Incoherent Effects*Journal of the Optical Society of America, 1971
- Measurement and Correction of First-Order Errors in EllipsometryJournal of the Optical Society of America, 1971
- General Treatment of the Effect of Cell Windows in Ellipsometry*Journal of the Optical Society of America, 1971
- Unified Analysis of Ellipsometry Errors Due to Imperfect Components, Cell-Window Birefringence, and Incorrect Azimuth Angles*Journal of the Optical Society of America, 1971
- Azimuthal Misalignment and Surface Anisotropy as Sources of Error in EllipsometryApplied Optics, 1970
- Analyses and Corrections of Instrumental Errors in EllipsometryJournal of the Optical Society of America, 1970
- Determination of the Optical Constants of Anisotropic Crystals*Journal of the Optical Society of America, 1969
- A Computer-Operated Following EllipsometerApplied Optics, 1967
- Ueber Oberflächenschichten. I. TheilAnnalen der Physik, 1889