Bulk trapping effect on carrier diffusion length as determined by the surface photovoltage method: Theory
- 1 May 1970
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 13 (5) , 609-617
- https://doi.org/10.1016/0038-1101(70)90140-1
Abstract
No abstract availableKeywords
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