Thin prism refraction. A new direct method of polariton spectroscopy
- 30 September 1981
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 39 (11) , 1209-1211
- https://doi.org/10.1016/0038-1098(81)91115-7
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Magneto-Brillouin scattering of polaritons in CdSSolid State Communications, 1980
- Two-photon Raman scattering and the polariton dispersion in CdSPhysical Review B, 1979
- Spatial Dispersion Effects in the Transmission Spectra of Semiconductors in the Region of Exciton ResonancesPhysica Status Solidi (b), 1979
- A quantitative study of excitonic polariton reflectance in CdSPhysica Status Solidi (b), 1978
- Determination of the Excitonic Polariton Dispersion in CuCl by Resonant Two-Photon Raman ScatteringPhysical Review Letters, 1978
- Nonlinear optical measurements in the excitonic region of CdS at 4.2 KPhysical Review B, 1978
- Observation of Forbidden Brillouin Scattering near an Exciton ResonancePhysical Review Letters, 1977
- Resonant Brillouin Scattering of Excitonic Polaritons in Gallium ArsenidePhysical Review Letters, 1977
- Luminescence from excitonic polaritons in CdSJournal of Luminescence, 1976
- Theoretical and Experimental Effects of Spatial Dispersion on the Optical Properties of CrystalsPhysical Review B, 1963