Electrical properties of the barrier layer/solution interface and its role during breakdown of anodic bismuth oxide films
- 1 March 1993
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 38 (4) , 511-517
- https://doi.org/10.1016/0013-4686(93)85006-k
Abstract
No abstract availableKeywords
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